Silicon Absorption Depth
Visualize how photon absorption depth in silicon varies with wavelength using the Beer-Lambert law. Understand why pixel thickness is a critical design parameter for quantum efficiency.
Silicon Absorption Depth Visualizer
Explore how light penetration depth in silicon depends on wavelength using Beer-Lambert law.
Model scope
Use this browser tool for intuition, relative trends, and design-space exploration. Its local simplified model is not a substitute for RCWA/FDTD sign-off, silicon calibration, or vendor process data.
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Beer-Lambert Absorption in Silicon
Silicon swallows different colours at different depths. Blue light is absorbed within the first few hundred nanometres near the surface, while red and near-infrared photons sneak much deeper before being absorbed — sometimes deeper than the photodiode reaches. That is why thin BSI pixels often lose near-IR sensitivity.
Silicon absorption depends strongly on wavelength. Blue light is absorbed near the surface, while red and NIR photons penetrate much deeper.
Assumptions
- Silicon absorption follows Beer-Lambert attenuation using wavelength-dependent absorption coefficient data.
- The model treats silicon as a uniform slab and does not include surface texturing, interference, or carrier collection probability.
- Absorbed photons are optical absorption events, not automatically collected electrons.
Outputs
- Absorption coefficient, penetration depth, and absorbed fraction versus wavelength and silicon thickness.
- A wavelength-regime map showing why blue absorbs near the surface and red/NIR requires thicker silicon.
Validation Example
- At fixed thickness, blue absorption should be higher than red/NIR absorption for typical visible silicon data.
- Increasing silicon thickness should help long wavelengths more than short wavelengths once blue absorption is already saturated.
Core Equations
- \(\alpha\): Absorption coefficient ($1/\mu\text{m}$)
- \(k\): Extinction coefficient
- \(\lambda\): Incident wavelength
The extinction coefficient k is converted to an absorption coefficient.
- \(I(z)\): Intensity at depth $z$
- \(I_0\): Intensity at the surface ($z=0$)
This is the Beer-Lambert law for a uniform absorbing medium.
- \(A(d)\): Absorbed fraction within thickness $d$
- \(d\): Silicon physical thickness
This ignores front-surface reflection and interference.
Model Interpretation
- Thin BSI pixels may collect visible light well but lose NIR photons.
- DTI, backside texture, and reflectors can increase the effective path length.
- Carrier collection depth is a separate electrical problem not included here.
Wavelength Regimes
- Blue light has large $\alpha$, so it is absorbed near the surface and is sensitive to surface passivation and shallow collection.
- Red and NIR light have smaller $\alpha$, so a thin silicon layer can transmit photons without useful absorption.
- The absorption length $1/\alpha$ is a useful scale, but 63% absorption at one length is not the same as high QE.
Device Implications
- Thicker silicon improves red/NIR absorption but may worsen crosstalk if carriers are generated far from the intended photodiode.
- Backside reflectors or light trapping can convert escape transmission into another absorption opportunity.
- Collection probability $\eta_{\text{cc}}(z)$ should be multiplied with the absorption profile for electrical QE.
Known Missing Physics
- Beer-Lambert absorption ignores interference from upper films and coherent standing waves inside the stack.
- The model does not include doping, temperature, strain, or free-carrier absorption changes in silicon.
- It predicts where photons are absorbed, not whether generated carriers are collected.
References
- Green, "Self-consistent optical parameters of intrinsic silicon at 300 K", Solar Energy Materials and Solar Cells, 2008
- Yokogawa et al., "IR sensitivity enhancement of CMOS Image Sensor with diffractive light trapping pixels", Scientific Reports, 2017
- Han, Chiou & Lin, "Deep trench isolation and inverted pyramid array structures...", Sensors, 2020