Interactive Simulators

Explore CMOS image sensor pixel optics through browser-based simulators. Calculations run locally in the browser — no server required.

Where these fit

The simulators are lightweight pedagogical tools: TMM, geometric optics, analytical camera equations, and visualizers. They are for intuition, classroom use, and design-space scoping. For physically accurate per-pixel QE / crosstalk / field maps, run the Python solver pipeline (RCWA/FDTD/Meep). See the scope table at the bottom for what each tool family does and does not cover.

Available Simulators

Optical Stack Analysis

• TMM QE Calculator — Configure a BSI pixel layer stack and compute quantum efficiency spectra in real time
• BARL Optimizer — Tune anti-reflection coating layer thicknesses to minimize reflectance
• Energy Budget Analyzer — Visualize where photon energy goes at each wavelength

Performance Analysis

• Angular Response — Study how QE changes with angle of incidence (CRA effects)
• SNR Calculator — Compute signal-to-noise ratio, dynamic range, and photon transfer curves

Design Tools

• Color Filter Designer — Design RGB filter spectra and visualize CIE chromaticity gamut
• Pixel Design Playground — Comprehensive pixel designer combining all parameters with multi-panel results

Optics & Wave Physics

• Si Absorption Depth — Visualize Beer-Lambert absorption in silicon and understand wavelength-dependent penetration depth
• Microlens Ray Trace — Trace rays through superellipse microlens geometry with Snell's law refraction and CRA effects
• Microlens Process Shape — Estimate final microlens gap, height, curvature, and profile from layout, reflow, and etch-transfer parameters
• MLA Array Visualizer — Visualize micro lens array geometry with configurable array patterns, asymmetric radii, height maps, and 2D ray tracing
• FDTI / BDTI Pixel Simulator — Compare full-depth front DTI with selectable-depth back DTI and visualize optical field confinement and crosstalk
• Fabry-Pérot Visualizer — Explore thin film interference with phasor diagrams and quarter-wave anti-reflection conditions
• Diffraction PSF Viewer — View Airy patterns, encircled energy, and pixel grid overlay for collection efficiency analysis

System Analysis

• MTF Analyzer — Compute pixel aperture, diffraction, and combined system MTF with Nyquist frequency analysis
• Pixel Scaling Trends — Explore how FWC, SNR, and diffraction limits scale with pixel pitch
• Color Accuracy Analyzer — Evaluate color reproduction with CCM computation and Delta E analysis on ColorChecker patches
• Dark Current & Temperature — Simulate Arrhenius dark current model and visualize thermal noise impact on image quality

Quick Validation Examples

Use these checks before trusting a simulator trend. They are intentionally simple: a good browser model should pass the limiting case before you interpret a complicated sweep.

Simulator	Sanity check	Expected behavior
TMM QE Calculator	Remove coating layers and compare normal-incidence air/Si reflection with $R=	(1-n_{Si})/(1+n_{Si})
Microlens Process Shape	Hold reflow fixed and increase etch time.	Final gap should decrease while height retention decreases; excessive etch should trigger a height-loss or over-etch warning.
Color Filter Designer	Narrow RGB filter FWHM while keeping peaks fixed.	Channel crosstalk should drop, but total signal and low-light SNR margin should also shrink.
SNR Calculator / Photon Transfer Curve	Sweep illumination with read noise fixed.	Low signal should be read-noise limited; high signal should follow shot-noise behavior, $\sigma \approx \sqrt{S}$.
Si Absorption Depth	Increase silicon thickness at red/NIR wavelengths.	Red/NIR absorption should improve more strongly than blue absorption because long wavelengths penetrate deeper.

Model Scope

Tool family	Model type	Best for
TMM / thin-film tools	1D planar multilayer optics	BARL trends, reflectance, silicon absorption, first-pass QE
Ray / geometry tools	Paraxial or Snell-law geometric optics	Microlens intuition, CRA directionality, layout sensitivity
Sensor metrics tools	Analytical camera equations	SNR, dynamic range, MTF, EMVA-style comparisons
Visualizers	Deterministic illustrative models	Explaining structure, relative trends, and failure modes

WARNING

Treat these as educational and design-space tools. They do not replace RCWA/FDTD sign-off, silicon calibration, or vendor process data. For solver workflows, see the Guide and Reports.